Last Updated： Aggregation Period:May 20, 2026～Jun 16, 2026
This ranking is based on the number of page views on our site.
Last Updated： Aggregation Period:May 20, 2026～Jun 16, 2026
This ranking is based on the number of page views on our site.
Last Updated： Aggregation Period:May 20, 2026～Jun 16, 2026
This ranking is based on the number of page views on our site.
1～30 item / All 200 items
Small quantity sales and custom orders are also welcome. Please feel free to contact us for contact probes!
A wide variety of sizes available for small quantity sales. Custom manufacturing is also accepted. Electrodes that allow for easy attachment and detachment for various electrical tests. *For more details, please download the PDF or contact us.*
We provide advanced processing technology cultivated through the production of contact probes and various inspection jigs.
Our company is a manufacturer of contact probes used for inspecting various electronic components, as well as inspection fixtures that utilize these probes. The technology required in these fields is at an extremely high level, characterized by "ultra-high precision" and "ultra-fine" specifications. Our technology, which has been refined over many years to meet these demands, has solved various challenges not only in inspection-related areas but also across a wide range of applications. We also offer this technology as a processing contract service. *For more details, please download the PDF or contact us.*
Achieving a pitch of P=0.2mm! Active in environments that require strict non-magnetic properties. Uses materials suitable for lead-free electrodes.
To non-magnetize contact probes, it is essential to review the materials and surfaces, but in practice, that alone is not sufficient for the product to be viable. It is only natural that they should be non-magnetic when measuring non-magnetic devices, but they must also possess performance tailored to the characteristics of the electrodes being inspected. Our company offers a lineup of "non-magnetic probes" that are suitable for lead-free electrodes, provide load control for contact probes, and achieve a pitch of P=0.2mm. [Features] ■ Materials suitable for lead-free electrodes ■ Load control for contact probes ■ Achieves pitch compatibility of P=0.2mm *For more details, please refer to the PDF document or feel free to contact us.
By bringing the tip of the contact probe closer to the outside, the gap between the two points can be minimized without changing the thickness of the pin. Pin pitch between 0.4mm and...
The "Kelvin Probe" has its tip positioned right at the edge of the probe's outer shape. By moving the tip outward, it is possible to minimize the gap between two points without changing the thickness of the pin. This allows for stable contact at a fixed position and the maintenance of load. Special board processing is required for use. Our company offers the fabrication of fixtures that can be installed according to the measuring equipment used by our customers. 【Features】 ■ The tip is positioned right at the edge of the probe's outer shape. ■ It can minimize the gap between two points without changing the thickness of the pin. ■ Stable contact at a fixed position. ■ It can maintain load. *For more details, please refer to the PDF document or feel free to contact us.
Compared to conventional BeCu products, it is equivalent or even superior, so wear resistance is not a concern.
At Seiken, in addition to our approach to surface treatment, we have re-evaluated the materials themselves. Traditionally, we used BeCu (beryllium copper), which required surface treatment. However, we have processed an alloy that excels in solder contact properties, allowing it to be used as is without any surface treatment. Even when cleaning the pin tips, the plating thickness is at most 1-2 micrometers, but since the alloy is used in its solid form, there is no risk of plating peeling that would expose the base material and degrade performance. Additionally, the hardness is comparable to or greater than that of traditional BeCu, so wear resistance is not a concern. This material can also be processed for probes in the P=80 micrometer class. *For more details, please refer to the PDF document or feel free to contact us.*
Flexible design and manufacturing according to inspection conditions. Small lots are also acceptable. Comprehensive support from assembly, wiring, to inspection.
Our company designs and manufactures "contact probes, IC sockets, and probe cards" used for semiconductor testing. ☆Contact Probes☆ We can flexibly accommodate not only standard products but also special specifications tailored to testing conditions. ☆Probe Cards and IC Sockets☆ We can provide consistent processing and assembly of resin, allowing us to offer testing fixtures suitable for the inspection target at a low cost. 【Examples of Support】 ◎ Narrow pitch support (manufactured with MIN P=80μ) ◎ High current testing (manufactured for pre-process testing of IGBT devices) ◎ Non-magnetic testing (probes made from non-magnetic materials) ◎ Others: high frequency (10GHz), high heat resistance (below 300℃), etc. 【Product Examples】 <Contact Probes> - Reduces replacement hassle. "Rare metal probes" with excellent durability. - Revised internal structure. "New bias probes" for stable resistance value measurement. <IC Sockets> - Non-magnetic compatible sockets. - High heat resistant sockets. <Probe Cards> - Probe cards compatible with min 80μ pitch. - High current load test probe cards. *For more details, please refer to the materials. Feel free to contact us with any inquiries.*
A specialized manufacturer of contact probes explains! How to use and replace standard probes and both-end probes.
We would like to introduce the usage of the "Contact Probe" that we handle. The "Standard Contact Probe (Single-End Probe)" is basically used in pairs with a socket due to the ease of replacement and wiring. The general method of using a contact probe involves drilling a hole in the resin, embedding a socket (receptacle) in it, and connecting the lead wires for wiring. Finally, the contact probe is inserted into the socket to complete the setup. Additionally, our website also provides information on "How to Use a Double-End Contact Probe" and "Replacing a Double-End Probe." [Content Included] ■ How to Use the Standard Probe ■ How to Use the Double-End Probe ■ Replacing the Double-End Probe *For more details, please refer to the PDF materials or visit our website.
Special inspection socket
From easy-to-handle mini press specifications to space-saving designs, we meet our customers' needs.
Custom order for contact probes
We design and manufacture contact probes tailored to your measurement conditions. With the evolution of electrical products, the requirements for measuring electronic components have become more stringent. We select and design probes that can be used in various situations, such as for high current conduction, use in high and low temperature ranges, and measurement of special materials. For more details, please contact us through our website. http://www.sankei-engineering.com/
Contact Probe CP Series (General Purpose) *Measurement Jigs Can Also Be Manufactured!
【Overview】 This is a contact probe with an external spring design, manufactured as an integrated unit. It is suitable for precision measurements because it can maintain low resistivity. ★ For more details about the series, please contact us or download the materials for review. ★ * We also accept requests for the production of fixtures for electrical measurements. You can request our services even without design drawings or knowledge of electrical measurements! We can handle everything from design, concepts, measurement methods, processing, assembly, to wiring. 【Examples of Measurement Fixtures】 Measurement fixtures for battery testing (cylindrical batteries, box-type batteries, lamicell batteries, button batteries, etc.) / Measurement fixtures for connector testing / Measurement fixtures for automotive component testing, etc.
Contact probe long stroke type *Measurement jig production is also possible!
【Overview】 This is a contact probe with an external spring design, manufactured as an integrated unit. Compared to the general-purpose CP series, it features a longer overall length and stroke. It is effective when there is a distance between the mounting position and the object being measured. ★ For more details about the series, please contact us or download the materials to view them. ★ * We also accept requests for the production of fixtures for electrical measurements. No design drawings or prior knowledge of electrical measurements are required! You can request everything from design, concept, measurement methods, processing, assembly, to wiring as a complete package. 【Examples of Measurement Fixtures】 Measurement fixtures for battery testing (cylindrical batteries, box-type batteries, lamicell batteries, button batteries, etc.) / Measurement fixtures for connector testing / Measurement fixtures for automotive component testing, etc.
It will be designed according to the measured current value for high current applications.
We design and manufacture contact probes tailored to your measurement conditions. With the evolution of electrical products, the requirements for measuring electronic components have become more stringent. We select and design probes that can be used in various situations, such as for high current conduction, use in high and low temperature ranges, and measurement of special materials. For more details, please contact us through our website. http://www.sankei-engineering.com/
It will be designed according to the measured current value for high current support.
We design and manufacture contact probes tailored to your measurement conditions. With the evolution of electrical products, the requirements for measuring electronic components have become more stringent. We select and design probes that can be used in various situations, such as for high current conduction, use in high and low temperature ranges, and measurement of special materials. For more details, please contact us through our website. http://www.sankei-engineering.com/
Non-magnetic contact probe made of copper alloy
【Overview】 In the non-magnetic contact probe NMB series, the components from the probe tip to the connection part are made of non-magnetic copper alloy, and by using electroless plating, the magnetism of the probe body is minimized. Are you facing conditions or situations like these? - You cannot inspect products without a non-magnetic probe... - The probe has become magnetic, causing the measurement object to stick... Please feel free to contact us. We will suggest a probe that meets your measurement conditions. For more details, please contact us through our website. http://www.sankei-engineering.com/
Easily exchange probes using a socket. *Measurement jigs can also be manufactured!
【Features】 ○ Easy probe replacement. - By pressing an adapter socket into the mounting board, probes can be replaced by simply inserting and removing them from the socket. ○ Choice of connection methods. - Terminal connection socket for the probe - Solder connection socket for the socket - Terminal connection socket for the socket If you have any questions regarding specific probe model numbers and compatible socket model numbers, please contact us. For an overview of the series, please check the catalog. For details on compatible adapter sockets for each contact probe model number, please inquire on our website. http://www.sankei-engineering.com/ * We also accept requests for the production of fixtures for electrical measurements. No design drawings are necessary, and no knowledge of electrical measurements is required! You can request everything from design, concept, measurement methods, processing, assembly, to wiring as a complete service. 【Examples of measurement fixtures】 Measurement fixtures for battery testing (cylindrical batteries, box-type batteries, lamicell batteries, button batteries, etc.) / Measurement fixtures for connector testing / Measurement fixtures for automotive component testing, etc.
It is a coaxial probe that can perform precise Kelvin measurements even during high current conduction.
【Overview】 ○ A single probe can connect terminals for both current and voltage. ○ Usable current: 50–300A (depending on size) ○ Heat resistance temperature: below 100℃ Product details can be confirmed from the catalog. The appropriate size varies depending on the current value. Please check the probe that matches your measurement conditions by contacting us through our website for more details. ● Sankei Engineering's website http://www.sankei-engineering.com/
Smooth movement is maintained even with high-speed sliding.
【Overview】 - The sliding parts are made of resin. - Durability of the sliding parts: over 5 million cycles* - Heat resistance temperature: below 100°C - Safe current: 5 to 35A* - Mounting flange diameter: 2.2 to 9.0mm - The probe has a low resistance value, enabling precise measurements with an integrated structure. *Durability and safe current values vary depending on the size of the probe. We can suggest probes that meet your conditions. For more details, please contact us through our website. ● Sankei Engineering Website ● http://www.sankei-engineering.com/
Secure the probe by screwing it onto the mounting board.
【Overview】 ○ Type that is screwed onto the mounting board ○ Durability of sliding parts: over 3 million times* ○ Heat resistance temperature: below 100°C ○ Safe current: 2–35A* ○ Mounting flange diameter: 1.6–10.0mm ○ Integrated structure with low resistance value of the probe, enabling precise measurements. ○ Prevents probe disconnection due to sliding of the probe or the rebound force of the spring. *Durability and safe current values vary depending on the size of the probe. We will suggest a probe that meets your conditions. For more details, please contact us through our website. ● Sankei Engineering Website ● http://www.sankei-engineering.com/
A probe that can be used in high-temperature environments and does not rotate at the tip.
【Overview】 ○ Heat resistance temperature: Below 200-300℃ ○ Durability of sliding parts: Over 200,000 cycles* ○ Safe current: 7-15A* ○ Mounting flange diameter: 3.5-5.0mm ○ Integrated structure with low probe resistance, enabling precise measurements. ○ Probe with heat-resistant spring incorporated into the CPR series with anti-rotation mechanism. *Durability and safe current values vary depending on the size of the probe. We will suggest a probe that meets your conditions. For more details, please contact us through our website. We also offer contract measurement services for measurements under high and low temperatures (compatible with -180 to 300℃). For details, please contact us through our website. ● Sankei Engineering Website ● http://www.sankei-engineering.com/
We provide products that match the material and shape of the workpiece, supporting the realization of your desired measurements!
For 40 years, we have been manufacturing contact probes used for various measurements. Based on the material, shape, and surface treatment of the workpiece, as well as measurement conditions (current value, energization cycle, ambient temperature, measurement speed), we will propose contact probes suitable for your usage conditions. If you have any questions or concerns regarding electrical measurements, please feel free to contact us through our website. ★http://www.sankei-engineering.com/★
![[Free Selection Service] Solving "Unexplained Stops" in High Current Testing Lines](https://image.mono.ipros.com/public/product/image/2001637296/IPROS10661475625659989221.png?w=280&h=280)
No more worrying about "unexpected inspection line stoppages"! We identify the root cause and achieve a stable inspection line.
Do you have any experience with these troubles on the high current inspection line? - The line keeps stopping without being able to identify the cause. - Various types of probes have been tried, but there is no improvement. - There are suspicions of overheating or poor contact, but it cannot be isolated. The trouble may actually be caused by "abnormal overheating at the contact points due to high current conduction." Furthermore, this abnormal overheating could be caused by multiple factors intricately intertwined, such as increased resistance at the contacts, the occurrence of tiny sparks, or exceeding specifications due to harsh operating environments. Therefore, we will take your actual measurement work and the probes that are currently problematic, conduct actual measurements and experiments on contact resistance and other factors using our in-house equipment, clarify the mechanism of abnormal occurrences, and select and propose the optimal contact probe that leads to trouble resolution based on objective evidence from actual measurement data. ★ Please feel free to consult us first through the inquiry form on our website or by phone.
For testing power modules and power control ICs! Solving challenges with a rich lineup and size customization.
In power device current testing, such as for power modules and power control ICs, do you have concerns like "I need to pass a large current despite the narrow electrode pitch"? At Sankei Engineering, we offer a wide range of contact probes designed to solve this challenge with "narrow pitch x large current compatibility." Our catalog includes products ranging from a minimum diameter of φ5.0mm (usable current up to 20A) to a maximum diameter of φ22.0mm (usable current up to 300A). Moreover, we can accommodate special electrode shapes and narrow pitch arrangements that are difficult to address with catalog items through custom orders. We can design and manufacture products optimized for your usage environment, including changes to the tip shape, adjustments to spring load, and size design tailored to your fixtures. We welcome inquiries at the stage of comparison and information gathering. Please feel free to consult us through the contact form on our website. *Please note that selecting large current probes requires caution. Here are the selection points and precautions [Power Device Selection Points URL].
For testing EV batteries and cylindrical cells! Solving challenges with a rich lineup and custom sizes.
In the charging and discharging tests of EV batteries and cylindrical cells, do you have any concerns such as: "I am looking for a probe that can withstand long hours of continuous current" or "The contact area of the electrode is small, and standard products do not fit"? Sankei Engineering offers a wide range of high-current contact probes designed to solve these issues for battery charging and discharging tests. Our catalog includes a broad lineup, from a minimum diameter of φ5.0mm (usable current under 20A) to a maximum diameter of φ22.0mm (usable current under 300A). Furthermore, for special electrode shapes that are difficult to accommodate with catalog products or when the contact area is small, we can manufacture custom probes by changing the tip diameter and shape. We also provide design and manufacturing of products optimized for your usage environment, including adjustments to spring load and size design tailored to fixtures. Inquiries during the comparison and information-gathering stage are also welcome. Please feel free to consult us through the contact form on our website. *Care should be taken when selecting high-current probes. For selection points and precautions, please refer to [Battery Selection Points URL].
![[Free Support] Resolving Probe Contact Issues in Power Device Power-On Testing](https://image.mono.ipros.com/public/product/image/2001642215/IPROS16655116577478468288.png?w=280&h=280)
Poor contact causes sparks. There is a risk of damaging expensive devices?! We will provide free support from identifying the cause of poor contact to selecting probes.
In power device conduction tests, do you have concerns such as, "The contact resistance varies, and the reliability of the data cannot be ensured" or "No improvement even after replacing the probes multiple times"? The causes of contact failure in conduction tests include a variety of factors, such as: - Mismatch between the probe tip shape and the work material - Wear of the probe tip - Adhesion of foreign substances - Deformation of the spring due to high temperatures leading to reduced load and identifying these issues is not easy. Especially in conduction tests that carry large currents, contact failures can lead to abnormal heating or sparking during conduction, potentially resulting in significant losses such as damage to expensive devices or equipment failures. Therefore, we collect your workpieces and the probes you are currently using and conduct experiments on contact resistance and other factors using our own equipment. We visualize the data to identify the root causes of contact failures. Based on this, we propose the optimal probe shape and load conditions tailored to your usage conditions and work characteristics, and we provide free support all the way to the selection that leads to actual improvements. Please feel free to consult us through the inquiry form.
![[Free Support] Resolving Probe Contact Issues in Circuit Board Inspection](https://image.mono.ipros.com/public/product/image/203351/IPROS14775864296526118773.png?w=280&h=280)
Resolve measurement errors due to poor contact! By identifying the root cause and selecting the optimal probe, we will improve inspection yield.
Are you experiencing issues on your printed circuit board inspection line such as: "Measurement values are unstable due to poor contact," "Inspection fails on good boards, leading to increased rework," "Even after replacing the probes, poor contact occurs again shortly after"? The causes of poor contact in board inspection are varied and can include: - Adherence of solder flux - Mismatch between the probe tip and the board's shape and material - Wear of the probe tip and can be difficult to identify. Therefore, we will take your workpieces and the probes you are currently using, and conduct experiments on our own equipment to measure contact resistance and other factors. We will visualize the data to identify the root causes of poor contact. Based on this, we will propose the optimal probe shape and load conditions tailored to your usage conditions and workpiece characteristics, and we will support you free of charge all the way to the selection that leads to actual improvements. Please feel free to contact us through the inquiry form.
Products with low resistance using alloy materials, high current compatible products, and high-frequency compatible probes!
Introducing the "Contact Probe" handled by MKT Taisei. These are high-precision products based on in-house watch parts processing technology, designed for semiconductor applications, low resistance products using alloy materials, high current compatible products, and high-frequency probes (up to 3GHz). Additionally, we can accommodate custom specifications (changes in tip shape, material, plating, spring load, dimensions, etc.) based on our in-house processing equipment and experience for products not listed in the catalog, tailored to meet customer requests. 【Features】 ■ High-precision products based on in-house watch parts processing technology ■ Low resistance products, high current compatible products, high-frequency probes (up to 3GHz) ■ Custom specifications tailored to customer requests *For more details, please refer to the PDF document or feel free to contact us.
Remove dirt from the connector and charging terminal to restore the flow of electricity.
Contact revival agent formulated with special additives based on 100% synthetic α-olefin.
Provides optimal solutions for the arrangement of oscilloscope probes, near-field magnetic and electric field probes for spectrum analyzers, antennas, and more.
To achieve the desired measurements, various adjustments may be necessary. In particular, it is essential to position the oscilloscope probes, near-field magnetic and electric field probes of the spectrum analyzer, and antennas in the correct direction and at the appropriate locations. To facilitate this, the universal probe holder eoPoD provides an optimal solution regardless of environmental conditions. Various applications are explained in the video below.
Passive near-field probe for measuring magnetic fields up to 40 GHz.
The HR-R 8-1 set includes the HR-R 8-1 B-field probe, which allows for magnetic field measurements up to 40GHz. The special probe head of the HR near-field probe enables direct measurements on IC pins or individual conductor tracks, allowing you to pinpoint the source of the B-field.
The connector is 3.5mm/F! The probe pitch can be selected from 50 to 1,000um!
We would like to introduce our RF_MEMS probe, the "TP26-Angle Series." The characteristic impedance is 50 ohms, and the frequency range is DC to 26.5 GHz, with an insertion loss (GSG-150um pitch typ.) of -0.4 dB. Please feel free to contact us if you have any inquiries. 【Features】 ■ Low loss, low reflection air coplanar probe design ■ Small probe footprint ■ Probe pitch selectable from 50 to 1,000 um ■ Probe repair and tip replacement available (Repair may not be possible depending on the damage condition) *For more details, please refer to the PDF document or feel free to contact us.
